SD NAND 可靠性验证测试

SD NAND可靠性验证测试的重要性

SD NAND可靠性验证测试至关重要。通过检验数据完整性、设备寿命、性能稳定性，确保产品符合标准，可提高产品的可信度、提高品牌声誉，减少维修成本，确保产品质量和市场竞争力。
MK-米客方德是一家做存储的公司，是SD NAND技术的引领者，工业应用的领导品牌。其公司SD NAND产品都有可靠性验证测试报告，

SD NAND可靠性验证测试报告

以MK-米客方德工业级SD NAND的MKDN064GCL-ZA型号为例，下面是可靠性验证测试的具体项目。

『Test Summary』

No	Test Item	Description	Result
1	Card Density Check	90%	Pass
2	Performance Test	HDBench/CrystalDiskMark/H2test	---
3	Compliance Test	TestMetrix VTE3100/VTE4100	Pass
4	Speed Class Test	TestMetrix VTE3100/VTE4100	Pass
5	Full Size Copy/Compare	H2test	Pass
6	Burn-in Test	BIT @-25~ 85’C	Pass
7	NPOR Test	Normal power cycle test when card is stand by	Pass
8	SPOR Test	Sudden power cycle test when card is busy	Pass
9	Read Only Test	H2test	Pass
10	IR-Reflow	260 ’C, check SLC data	Pass
11	Power consumption	Write & Read current measurement	---

Test Item

1. Card DensityCheck

Test Tool & Environment	SDFormatter Win7OS
Sample Quantity	1ea
Result	7374MB, 90%

1. PerformanceTest
   1. HDBench / CrystalDiskMark / IOMeter /H2test

Test Tool & Environment	HDBench Ver3.40 / CrystalDiskMark 6.0 / IO meter / H2 test Card Reader : Transcend TS-RDP5K(GL834) Win7OS IOMeter
Test Criteria	Depends on customer criteria
Sample Quantity	2ea
Result	Pass (see 2.4 performance data)

Test Tool & Environment	1. IO Meter 2006.07.27 Card Reader : Transcend TS-RDP5K(GL834) Win7OS TestMetrix
Test Criteria	Depends on customer criteria
Sample Quantity	2ea
Result	Pass (see 2.4 performance data)

Test Tool & Environment	1. TestMetrix VTE3100/VTE4100
Test Criteria	Depends on customer criteria
Sample Quantity	3ea
Result	Pass (see 2.4 performance data)

1. Performance Data

Test Item	Test Mode	Result
HDBench (100MB)	Sequential Read (MB/s)	46.2
	Sequential Write (MB/s)	24.2
CrystalDiskMark (100MB)	Sequential Read (MB/s)	47.5
	Sequential Write (MB/s)	26
IOMeter (100MB)	Random Write (IOPS)	572.6
	Random Read (IOPS)	1119.5
TestMetrix	Sequential Read (MB/s)	24.4
	Sequential Write (MB/s)	10
H2test	Sequential Read (MB/s)	40.6
	Sequential Write (MB/s)	10

1. ComplianceTest

Test Tool & Environment	TestMetrix VTE3100/VTE4100
Test Criteria	Test done without error
Sample Quantity	3ea
Result	Pass

1. Speed ClassTest

Test Tool & Environment	1. TestMetrix VTE3100/VTE4100
Test Criteria	Pass class 6 condition
Sample Quantity	3ea
Result	Pass

Speed Class	Test Mode	Result
Class6	Pw (MB/s)	8.5
	Pr (MB/s)	9.6

1. Full SizeCopy/Compare

Test Tool & Environment	H2testv1.4 Card Reader : Transcend TS-RDP5K(GL834) Win7OS
Test Criteria	Test done without no error
Sample Quantity	2ea
Result	Pass

1. Burn-in Test

BIT v8.0

Test Tool & Environment	BurnInTestv8.0 Card Reader : Transcend TS-RDP5K(GL834) Win7OS
Test Criteria	168hours without error @25/85/-25’C
Sample Quantity	Total 6ea
Result	Pass

1. NPORTest

Test Tool & Environment	1.MK NPOR Tool
Test Criteria	Pass 10K cycles
Sample Quantityv	2ea
Result	Pass

1. SPOR
   1. SPORTest1

Test Tool & Environment	1.MK SPOR Tool – 5%/95% non-file system
Test Criteria	Pass 10K cycles
Sample Quantity	2ea
Result	Pass

1. SPORTest2

Test Tool & Environment	1. Specific SPOR Tool – small/large file system based
Test Criteria	Pass 10K cycles
Sample Quantity	2ea
Result	Pass

1. Read OnlyTest

Test Tool & Environment	H2test Card Reader : Transcend TS-RDP5K(GL834) Win7OS
Test Criteria	72hours without error
Sample Quantity	4ea
Result	Pass

1. IR-reflow

Test Tool & Environment	IR-reflow 260 ‘C
Test Criteria	3 times test and check all data without error
Sample Quantity	10ea
Result	pass

1. Powerconsumption

Test Tool & Environment	CrystalDiskMark6.0 Card Reader : Transcend TS-RDP5K(GL834) Win7OS AgilentU1252B
Item	Standby current(uA)	Operating current (mA)		Throughput (MB/s)
#1	210	Read	96	47.6
		Write	81	26.6
#2	211	Read	95	47
		Write	83	26.8
#3	210	Read	96	48
		Write	81	27