创新引领 巨头云集 | SPEA邀您打卡Semicon West 2024

Semicon West被誉为北美地区最具影响力的半导体展会，吸引全球顶尖的半导体厂商、研究机构和专家人士，展示前沿创新技术与应用，推动产业链交融碰撞，已成为全球半导体企业重要的技术交流平台、汇聚地和风向标。

Semicon West 2024将于7 月 9—11日在旧金山莫斯康中心举办。作为半导体测试领域的领导者，SPEA当然不会缺席。我们将在南大厅 965 号展位展示创新产品（DOT800多核混合信号测试仪、DOT800T功率半导体测试仪）。

期待大家莅临交流，共同探讨行业的未来发展，携手开启新的合作篇章。

DOT800——赋能提升测试效率

Visitorsto the SPEA booth will have the opportunity to experience the future of testingwith the SPEA Device Oriented Tester (DOT) platform. This revolutionarymixed-signal tester leverages a unique “tester-in-a-board” concept, integratingall test resources onto a single board. This simplifies connections betweentester channels and devices under test, streamlining the entire testingprocess.

到访SPEA展位的观众，将有机会现场接触SPEA 面向设备的测试仪 (DOT800) 。这款革命性的混合信号测试仪运用独特的“板上测试仪”概念，将所有测试资源集成到一块板上。这简化了测试仪通道和被测设备之间的连接，从而简化整个测试过程。

TheDOT’s multi-processor, multi-function channel architecture seamlessly combinesanalog, digital, and signal processing capabilities. This includes multiplecontrol CPUs, DSP modules, and programmable logic units. The modular andconfigurable design allows for the inclusion of an on-board controller and upto four channel cards, enabling customization to perfectly match individualtesting requirements.

DOT800测试仪的多处理器、多功能通道架构将模拟、数字和信号处理能力无缝衔接。它包括多个控制CPU、DSP模块和可编程逻辑单元。模块化和可配置的设计允许包含一个板载控制器和最多四个通道卡，赋能定制化、个性化测试需求。

Eachchannel card boasts a dedicated matrix card, further simplifying load boarddesign and reducing relay usage. SPEA’s DOT platform eliminates the need formultiple instruments of different types, allowing for a system comprised ofidentical, replicable instruments. This significantly reduces systemcomplexity, simplifies programming and maintenance, and ensures exceptionaldevice test coverage.

每个通道卡都拥有专用的矩阵卡，进一步简化了负载板设计，并减少了继电器的使用。SPEA 的 DOT 800消除对多种不同类型仪器的需求，从而允许由相同的、可复制的仪器组成一套系统。它能显著降低了系统复杂性，简化编程和维护，确保出色的测试覆盖率。

DOT800T——功率半导体测试综合解决方案

SPEAwill also be showcasing its DOT800T platform, a comprehensive solution forpower semiconductor testing. This versatile platform integrates all necessaryresources for performing ISO, AC, and DC tests on a wide range of powerapplications within a single machine. Designed specifically for testingtraditional silicon devices alongside cutting-edge Gallium Nitride and SiliconCarbide technologies, the DOT800T boasts industry-leading voltage and currentsource capabilities, along with high-frequency and low-current measurementprecision.

SPEA 还将展示 DOT800T ，它是一套满足功率半导体测试的综合解决方案。该多功能测试仪将全范围功率应用中进行 ISO、AC、DC 测试所需的所有资源集成到一套设备中。专为测试传统硅器件以及氮化镓和碳化硅技术而设计，DOT800T拥有业界领先的电压和电流源功能，以及高频、低电流量测精度。

TheDOT800T’s multi-core architecture facilitates accurate execution of static,dynamic, and isolation tests across dedicated stations, each equipped with anindependent controller. Multiple test programs can be run concurrently inasynchronous mode, with each core controller managing its own resources,instrument connections, and test program execution.

DOT800T的多核架构有助于跨专用站准确执行静态、动态和隔离测试，每个专用站都配备独立的控制器。多个测试程序能以异步模式同时运行，每个核心控制器管理自己的资源、仪器连接和测试程序执行。