| Number of channels (#) | 4 |
| Total supply voltage (Max) (+5V=5, +/-5V=10) | 44 |
| Total supply voltage (Min) (+5V=5, +/-5V=10) | 4 |
| Rail-to-rail | In to V- |
| GBW (Typ) (MHz) | 6 |
| Slew rate (Typ) (V/us) | 45 |
| Vos (offset voltage @ 25 C) (Max) (mV) | 2.4 |
| Iq per channel (Typ) (mA) | 3.45 |
| Vn at 1 kHz (Typ) (nV/rtHz) | 10.5 |
| Rating | HiRel Enhanced Product |
| Operating temperature range (C) | -55 to 125 |
| Offset drift (Typ) (uV/C) | 1.7 |
| Features | High Cload Drive |
| Input bias current (Max) (pA) | 1500000 |
| CMRR (Typ) (dB) | 108 |
| Output current (Typ) (mA) | 31 |
| Architecture | Bipolar |
- Controlled Baseline
- One Assembly Site
- One Test Site
- One Fabrication Site
- Extended Temperature Performance of –55°C to 125°C
- Enhanced Diminishing Manufacturing Sources (DMS) Support
- Enhanced Product-Change Notification
- Qualification Pedigree(1)
- Low Noise
- 10 Hz...15 nV/
Hz - 1 kHz...10.5 nV/Hz
- 10 Hz...15 nV/
- 10 000-pF Load Capability
- 20-mA (Min) Short-Circuit Output Current
- 27-V/μs Slew Rate (Min)
- High Gain-Bandwidth Product...5.9 MHz
- Low VIO...900 µV (Max) at 25°C
- Single or Split Supply...4 V to 44 V
- Fast Settling Time
- 340 ns to 0.1%
- 400 ns to 0.01%
- Saturation Recovery...150 ns
- Large Output Swing...VCC– + 0.1 V to VCC+ – 1 V
(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to Highly Accelerated Stress Test (HAST)or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specificed performance and environmental limits.
Excalibur is a trademark of Texas Instruments.
The TLE214x devices are high-performance, internally compensated operational amplifiers built using the Texas Instruments complementary bipolar Excalibur. process. They are pin-compatible upgrades to standard industry products.
The design incorporates an input stage that simultaneously achieves low audio-band noise of 10.5 nV/
/100-pF load is useful in fast actuator/positioning drivers. Under similar test conditions, settling time to 0.01% is 400 ns.
The devices are stable with capacitive loads up to 10 nF, although the 6-MHz bandwidth decreases to 1.8 MHz at this high loading level. As such, the TLE214x are useful for low-droop sample-and-holds and direct buffering of long cables, including 4-mA to 20-mA current loops.
The special design also exhibits an improved insensitivity to inherent integrated circuit component mismatches as is evidenced by a 900-μV maximum offset voltage and 1.7-μV/°C typical drift. Minimum common-mode rejection ratio and supply-voltage rejection ratio are 85 dB and 90 dB, respectively.
Device performance is relatively independent of supply voltage over the ±2-V to ±22-V range. Inputs can operate between VCC? ? 0.3 V to VCC+ ? 1.8 V without inducing phase reversal, although excessive input current may flow out of each input exceeding the lower common-mode input range. The all-npn output stage provides a nearly rail-to-rail output swing of VCC? ? 0.1 V to VCC+ ? 1 V under light current-loading conditions. The device can sustain shorts to either supply since output current is internally limited, but care must be taken to ensure that maximum package power dissipation is not exceeded.
Both versions can also be used as comparators. Differential inputs of VCC± can be maintained without damage to the device. Open-loop propagation delay with TTL supply levels is typically 200 ns. This gives a good indication as to output stage saturation recovery when the device is driven beyond the limits of recommended output swing.
The TLE214x devices are available in industry-standard 8-pin and 16-pin small-outline packages. The devices are characterized for operation from ?55°C to 125°C.
