固体钽电容的失效模式

Generally, tantalum capacitor failuremodes have been discussed both for the standardmanganese dioxide cathode and the newconductive polymer (CP) type. For standardtantalum in the normal operation mode, anelectrical breakdown can be stimulated by anincrease of the electrical conductance in channelby an electrical pulse or voltage level. This leadsto capacitor destruction followed by thermalbreakdown. In the reverse mode, we havereported that thermal breakdown is initiated by anincrease of the electrical conductance by Jouleheating at a relatively low voltage level.Consequently, a feedback cycle consisting oftemperature - conductivity - current - Joule heat -temperature, ending with electrical breakdownwas created. Both of these breakdown modespossess a stochastic behavior and can be hardlylocalized in advance.