New Enhanced Agilent Nano Suit

Features and Benefits
• New test method development
offers easier, more user-friendly
protocol scripting
• Enhanced imaging capabilities,
including profi le cross-sectional
imaging, real-time adjustment of
scanning parameters, plane-fi t
leveling, and more
• Survey scanning option allows
scanning of areas up to
500 µm x 500 µm
• Experiment data analysis using
the most powerful, comprehensive
software
• Support of small force / small
displacement measurements,
from MEMS testing to tensile
experiments, surface topology,
polymers, and more
• Simulation mode enables offl ine
sample setup, sample runs, method
writing, and data analysis
• Integrated 2D plotting tool with
easy-to-read statistical analysis
• Analyst software assists data
analysis, software updates provide
the latest improvements, and
System Agent enables automatic
software reporting